The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
Sep. 09, 2004
Akimitsu Shimamura, Osaka, JP;
Akimitsu Shimamura, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A method of testing a semiconductor apparatus includes a step of dividing a region in the semiconductor apparatus into a plurality of divided regions, a step of extracting all of paths starting at registers and terminating at other registers present in the respective divided regions as candidate paths, a step of calculating delay times in signal transmissions of the candidate paths and selecting the candidate path having a maximum delay time in each divided region as a critical path, and a step of conducting a delay test for the critical path in each divided region to thereby accurately screen the semiconductor apparatus.