The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2007

Filed:

Dec. 31, 2003
Applicants:

Narendra Amalendu Soman, Niskayuna, NY (US);

Murali Mohan Reddy Nagella, Andhra Pradesh State, IN;

N. Deva Prasanna Kumar, Andhra Pradesh State, IN;

Chandrakant Naik Tari, Goa, IN;

Inventors:

Narendra Amalendu Soman, Niskayuna, NY (US);

Murali Mohan Reddy Nagella, Andhra Pradesh State, IN;

N. Deva Prasanna Kumar, Andhra Pradesh State, IN;

Chandrakant Naik Tari, Goa, IN;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for performing a gap stack-up analysis for a machine gap. The gap is defined by opposing faces of two machine parts. A vector loop is determined beginning at one of the opposing faces, traversing through the machine parts that affect the gap dimension and terminating on the other opposing face. The dimensions and the tolerances associated with each of the parts in the vector loop are combined to yield the gap dimension and the gap tolerance. In one embodiment the gap stack-up is determined by a computer program product for execution by a computer processor.


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