The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
Sep. 11, 2006
Toshiharu Miwa, Kariya, JP;
Kenji Tamaki, Kawasaki, JP;
Toshiharu Miwa, Kariya, JP;
Kenji Tamaki, Kawasaki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In a method for determining a design parameter in a product design parameter determination supporting system, interaction between product function and design parameter is structured, a design parameter group with reduced interaction is extracted, an experiment design is prepared based upon the design parameter group, modeling of a quality influence degree between product function and design parameter is performed from an experiment result, and coordination process of a design parameter and estimation of a product function are performed with taking into account a manufacturing variation. By this means, it is possible to realize a system which can determine many design parameters extremely efficiently even in the product development where there are many design parameters and product functions to be handled and interactions are present between the design parameters and product functions.