The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2007

Filed:

Jul. 12, 2006
Applicants:

Tetsuya Horiuchi, Tokyo, JP;

Junko Sekiguchi, Tokyo, JP;

Inventors:

Tetsuya Horiuchi, Tokyo, JP;

Junko Sekiguchi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The quality of an image can be improved and radiation can effectively be utilized. In an imaging area of a subject where a main scan is performed, a specific scan area setting unit sets a specific scan area where a scan is performed under a specific scan condition allowing radiation exposure dose on the subject to be low. Then, the scan condition setting unit sets a main scan condition so that the specific scan area is scanned under the specific scan condition allowing the radiation exposure dose on the subject to be low.


Find Patent Forward Citations

Horiuchi, Tetsuya. (2007). Radiation tomography apparatus and scan condition setting device (U.S. Patent No. 7289596). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7289596

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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