The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
Jun. 07, 2005
Applicant:
Kenichi Koyama, Sagamihara, JP;
Inventor:
Kenichi Koyama, Sagamihara, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope illumination intensity measuring device has a light-receiving unit that outputs a signal representing an intensity of received light, a moving mechanism that places the light-receiving unit on an observation optical axis of the microscope as needed, a converter that converts a signal output from the light-receiving unit into light intensity information, a wavelength selection unit that sets a wavelength for light to be measured, and a display unit that displays the light intensity information.