The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2007

Filed:

Oct. 04, 2005
Applicants:

David N. Strafford, Pittsford, NY (US);

Michael L. Melocchi, Rochester, NY (US);

Inventors:

David N. Strafford, Pittsford, NY (US);

Michael L. Melocchi, Rochester, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and method for measuring a fusion seal quality within a structure comprising a source for providing a focused optical beam of a known intensity to a fusion seal within a structure, the fusion seal reflecting the optical beam according to the fusion seal quality, a receiver for receiving the reflected optical beam and a processor are presented for measuring a intensity ratio between the reflected optical beam and the focused optical beam relating to fusion seal quality. The device may scan the structure and provide an intensity ratio image map for a region within the structure related to fusion seal quality.


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