The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2007

Filed:

Feb. 03, 2004
Applicant:

Christopher Webb, Greeley, CO (US);

Inventor:

Christopher Webb, Greeley, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/208 (2006.01); H04N 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Digital cameras and methods that provide improved image alignment for panorama image capture. The present invention identifies features that will likely be used by a stitching algorithm, and highlights those features for a user by superimposing them on top of a 'liveview' image presented on a display of the digital camera. By applying an edge detection algorithm to the previously captured image, the user can select and display those features of the previous image that are relevant to aligning the camera for the subsequent image.


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Quick Actions:

Webb, Christopher. (2007). Method for providing image alignment feedback for panorama (composite) images in digital cameras using edge detection (U.S. Patent No. 7289147). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7289147

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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