The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
Jul. 19, 2004
Applicant:
Iain Robert Gordon-ingram, Wiltshire, GB;
Inventor:
Iain Robert Gordon-Ingram, Wiltshire, GB;
Assignee:
Renishaw, PLC, Gloucestershire, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a reference mark detector for use with a metrological scale or encoder () having a patterned reference mark rm movable relative to the reference mark detector. The detector may comprise a photodetector array () for detecting the patterned reference mark, the array comprising at least two sets of detector elements A and B each set being formed as a pattern which relates to the pattern of the reference mark. The two sets may be separate rows of photodectors or different elements of the same row of photodetectors. The pattern is preferably irregular.