The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2007

Filed:

Jun. 10, 2005
Applicants:

Chiu-wang Chen, Huatan Shiang, TW;

Tai-kang Shing, Taipei, TW;

Yung-feng Nien, Taichung, TW;

Shyuan-yueh Lin, Banqiao, TW;

Inventors:

Chiu-Wang Chen, Huatan Shiang, TW;

Tai-Kang Shing, Taipei, TW;

Yung-Feng Nien, Taichung, TW;

Shyuan-Yueh Lin, Banqiao, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25B 23/142 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides an apparatus for measuring torque of a torque tool by using an indirect structure arranged on one side of the torque tool, in which the apparatus comprises a microstructure part connected with a side surface of the torque tool. The microstructure part further comprises a sensing structure for sensing the strain or displacement generated by a force exerted on the torque tool and converting the strain or displacement into an electrical signal. The electrical signal is then properly calibrated and processed for transforming units by a System-on-Chip (SoC), and converted into the torque value exerted by the user and the value is displayed on a display device.


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