The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
May. 11, 2005
Masami Sukeda, Takahagi, JP;
Yasuaki Kageyama, Hitachi, JP;
Norihiro Watanabe, Hitachi, JP;
Shinya Odajima, Hitachi, JP;
Hideo Tanahashi, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Yoshinori Musha, Hitachiota, JP;
Kazutoshi Ikeda, Hitachi, JP;
Masami Sukeda, Takahagi, JP;
Yasuaki Kageyama, Hitachi, JP;
Norihiro Watanabe, Hitachi, JP;
Shinya Odajima, Hitachi, JP;
Hideo Tanahashi, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Yoshinori Musha, Hitachiota, JP;
Kazutoshi Ikeda, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Engineering Co., Ltd., Hitachi-shi, JP;
Abstract
A method of connecting hollow conductors with a brazing alloy employs a measuring mechanismfor measuring a connecting state of a connecting portion after brazing hollow conductors. The measuring mechanism comprises a scannerand a holder, which are separated in advance, so that the mechanism can be installed in a narrow space. A display mechanismdisplays measuring results as tow-dimensional patterns, and the evaluation mechanismevaluate the connecting portions by an area of the defects and an integral length of sound portions. A judgment mechanismevaluates relative relation of the measuring results with causes-and-defects, which are previously stored, and shows the cause of the defect.