The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
May. 15, 2003
Calvin Dean Ward, Rochester, MN (US);
Calvin Dean Ward, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems, and media for correlating error events of a cluster are disclosed. Embodiments may identify systems of a cluster potentially impacted by an error and identify one or more error events associated with those systems. Then, embodiments may select one of the identified error events based upon data associated with the identified error event, disregarding other identified error events generated for the same error or errors symptomatic of the error, to report the error to a maintenance provider via a single error event. Many embodiments may identify one or more error events potentially resulting from the same error by identifying error events within a specified time period of the event that triggered the correlation. Several embodiments correlate the error events in an environment that is substantially independent of the cluster. Further embodiments obtain data that describes system interconnections of the cluster and generate a topology based upon the data.