The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Jan. 29, 2004
Applicants:

Victor Rosenman, Tel-Aviv, IL;

Olga Kuturianu, Bat Yam, IL;

Inventors:

Victor Rosenman, Tel-Aviv, IL;

Olga Kuturianu, Bat Yam, IL;

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an arrangement for testing multiple low-end computing devices simultaneously, different tests are executed simultaneously on different platforms using a single instance of a test harness to which multiple devices are connected. A platform-specific API is provided for independent components of the tests and platform-specific components are implemented for each test according to the respective platform-specific API. At run-time the test harness deploys each test together with a platform-specific execution agent, configured according to the components of the test. The agents execute the test suites, and return test results to the test harness.


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