The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Sep. 16, 2004
Hyeung-yun Kim, Palo Alto, CA (US);
Hyeung-Yun Kim, Palo Alto, CA (US);
Advanced Structure Monitoring, Inc., Cupertino, CA (US);
Abstract
Methods and recordable media for monitoring structural health conditions. The present invention provides a method for interrogating a damage of a host structure using a diagnostic network patch (DNP) system having patches. An interrogation module partitions the plurality of patched in subgroups and measures the sensor signals generated and received by actuator and sensor patches, respectively. Then, a process module loads sensor signal data to identify Lamb wave modes, determine the time of arrival of the modes and generate a tomographic image. It also determines distribution of other structural condition indices to generate tomographic images of the host structure. A set of tomographic images can be stacked to generate a hyperspectral tomography cube. A classification module generates codebook based on K-mean/Learning Vector Quantization algorithm and uses a neural-fuzzy-inference system to determine the type of damages of the host structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile