The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Oct. 02, 2003
Applicants:

Laszlo B. Kish, College Station, TX (US);

Gabor Schmera, San Diego, CA (US);

Inventors:

Laszlo B. Kish, College Station, TX (US);

Gabor Schmera, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01N 19/00 (2006.01); B32B 5/02 (2006.01); B32B 27/04 (2006.01); B32B 27/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method of fluctuation enhanced gas-sensing using SAW devices includes processes for improved chemical analyte detection, identification, and quantification through the measurement and spectral analysis of frequency fluctuations in the instantaneous frequency of a chemical sensor arranged to produce an oscillatory output signal when exposed to chemical substances. The system and method may use a chemical sensor, such as a surface acoustic wave (SAW) device. The spectral analysis produces the power spectral density of the frequency fluctuations, which are represented as a pattern that includes information about the analyte(s) such as, total adsorbed gas mass and diffusion coefficients. The diffusion coefficients may then be used to determine the number of molecule types and/or the concentration of each.


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