The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Aug. 28, 2003
Applicants:
Kazuhiko Arai, Hachioji, JP;
Akio Kosaka, Hachioji, JP;
Takashi Miyoshi, Atsugi, JP;
Kazuhiko Takahashi, Hachioji, JP;
Hidekazu Iwaki, Hachioji, JP;
Inventors:
Kazuhiko Arai, Hachioji, JP;
Akio Kosaka, Hachioji, JP;
Takashi Miyoshi, Atsugi, JP;
Kazuhiko Takahashi, Hachioji, JP;
Hidekazu Iwaki, Hachioji, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system comprises a calibration pattern which has a known geometric pattern formed on a plurality of three-dimensionally arranged planes, and a relative position and posture fixing section which fixes relative position and posture between the calibration pattern and the imaging system.