The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Jun. 07, 2003
Applicants:

Niranjan Damera-venkata, Mountain View, CA (US);

Nelson Liang an Chang, Palo Alto, CA (US);

Debargha Mukherjee, San Jose, CA (US);

Mei Chen, Los Altos, CA (US);

Ken K. Lin, Redwood City, CA (US);

Inventors:

Niranjan Damera-Venkata, Mountain View, CA (US);

Nelson Liang An Chang, Palo Alto, CA (US);

Debargha Mukherjee, San Jose, CA (US);

Mei Chen, Los Altos, CA (US);

Ken K. Lin, Redwood City, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for estimating motion of each of a plurality of tessels in an intermediate image relative to a reference image, which includes searching the reference image to find points that lie along epipolar lines in the reference image corresponding to upper-left and lower-right vertices of the tessel, respectively, that result in a best-matching shape; estimating a depth of each of at least two of the vertices of the tessel; and using the depth estimates of the at least two vertices of the tessel to estimate the motion of the tessel relative to the best-matching shape.


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