The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Jun. 12, 2003
Applicants:

Jiwei Yang, North York, CA;

Gordon Mawdsley, North York, CA;

Martin Yaffe, Toronto, CA;

Inventors:

Jiwei Yang, North York, CA;

Gordon Mawdsley, North York, CA;

Martin Yaffe, Toronto, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for determining a degree of deflection in a breast compression plate. The mammography apparatus further includes an optical measuring device. The method and apparatus involve (a) providing a pattern on the breast compression plate, the pattern being imagable by the optical measuring device, and having a plurality of local pattern indicia; (b) adjusting the breast compression plate to a selected height; (c) imaging the breast compression plate using the optical measuring device to provide an image of the pattern, the image having a plurality of local image indicia including an associated local image indicia for each local pattern indicia in the plurality of local pattern indicia; and (d) for each local pattern indicia in the plurality of local pattern indicia, determining an associated local deflection of the breast compression plate from the associated local image indicia.


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