The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Jan. 25, 2006
Baojun LI, Waukesha, WI (US);
Rowland Saunders, Hartland, WI (US);
John Sandrik, Wauwatosa, WI (US);
Xianfeng NI, Merton, WI (US);
Baojun Li, Waukesha, WI (US);
Rowland Saunders, Hartland, WI (US);
John Sandrik, Wauwatosa, WI (US);
Xianfeng Ni, Merton, WI (US);
General Electric Co., Schenectady, NY (US);
Abstract
A method and apparatus for tomosynthesis image quality control for a tomosynthesis imaging system. The method and apparatus including: positioning a phantom having an edge of predetermined sharpness at a predetermined angle relative to an imaging plane of an x-ray detector; performing tomosynthesis acquisition and generating one or more slice images using one or more three-dimensional reconstruction algorithms; selecting a slice image to be measured from the one or more slice images; identifying a sharpest edge in the slice image to be measured, wherein the sharpest edge in the slice image to be measured includes the in-focus portion of the phantom; inputting the slice image to be measured and coordinates of the sharpest edge in the slice image to be measured into a modulation transfer function (MTF) algorithm; and, using the MTF algorithm, calculating the in-plane resolution and slice thickness of the slice image to be measured.