The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Jul. 28, 2006
Takeshi Mochizuki, Hitachinaka, JP;
Kazutaka Setoma, Hitachinaka, JP;
Satoru Wada, Hitachinaka, JP;
Ricoh Printing Systems, Ltd., Tokyo, JP;
Abstract
The invention aims at provision of an optical scanner in which an optics required for equalizing an optical magnification in a scanning range is produced with high accuracy, so that intervals among a plurality of scanning lines on a to-be-scanned surface are even in the scanning range. The scanning optics includes a refraction surface and a reflection surface whose sub-scanning-direction curvature radii vary continuously. The reflection surface is disposed on the to-be-scanned surface side of the refraction surface. The curvature radius of the reflection surface varies symmetrically with respect to the optical axis, and the curvature radius of the refraction surface varies asymmetrically with respect to the optical axis.