The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Dec. 21, 2004
Applicants:
Stephen J. Caracci, Elmira, NY (US);
Norman H. Fontaine, Painted Post, NY (US);
Eric J. Mozdy, Elmira, NY (US);
Po Ki Yuen, Corning, NY (US);
Inventors:
Stephen J. Caracci, Elmira, NY (US);
Norman H. Fontaine, Painted Post, NY (US);
Eric J. Mozdy, Elmira, NY (US);
Po Ki Yuen, Corning, NY (US);
Assignee:
Corning Incorporated, Corning, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Optical interrogation systems and methods are described herein that are capable of measuring the angles (or changes in the angles) at which light reflects, transmits, scatters, or is emitted from an array of sensors or specimens that are distributed over a large area 2-dimensional array.