The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Apr. 15, 2004
Toshiyuki Suzuki, Aichi, JP;
Toshiyuki Suzuki, Aichi, JP;
Tomey Corporation, Nagoya Aichi, JP;
Abstract
A measurement device may illuminate lensto be inspected with light at a plurality of different angles of incidence. The transmitted light that passes through lensmay be preferably detected by light detecting means. When light detecting meansdetects the light, it outputs an electrical signal. Control unitmay (1) align light sourcein the predetermined position and turns it on and (2) calculate the degree of refraction of the transmitted light that passes through lens, based upon the electrical signal output from light detecting means. Then, control unitmay further (3) conduct illumination at a plurality of different angles of incidence and obtain a plurality of 'angle of incidence—degree of refraction' relationships from the degree of refraction calculated for each angle of incidence, and (4) calculate the fundamental data of lensby using the plurality of 'angle of incidence—degree of refraction' relationships.