The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Aug. 11, 2005
Applicants:

James Kolanek, Goleta, CA (US);

Eric Carlsen, Fairborn, OH (US);

Inventors:

James Kolanek, Goleta, CA (US);

Eric Carlsen, Fairborn, OH (US);

Assignee:

Sierra Nevada Corporation, Sparks, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A long baseline interferometer antenna system and method for determining the location of an emitter. The long baseline interferometer antenna system comprises a first antenna, a second antenna, an inertial navigation system, an antenna baseline measurement system, a multi-channel receiver and a processor. The first and second antenna elements are positioned on a platform and are both configured to receive signals from the emitter. The first and second antenna elements form a long baseline antenna pair. The inertial navigation system measures the platform position and attitude; and the antenna baseline measurement system measures the antenna baseline vector between the first and second antenna elements. The multi-channel receiver measures the differential phase between antenna pairs, and the processor computes the emitter location. Additional antenna elements can be included and some can be configured as squinted beam pair and make use of amplitude difference of arrival measurements.


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