The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Dec. 03, 2004
Walthard Vilser, Rudolstadt, DE;
Bernd-ullrich Seifert, Griesheim, DE;
Christine Kassner, Ilmenau, DE;
Walthard Vilser, Rudolstadt, DE;
Bernd-Ullrich Seifert, Griesheim, DE;
Christine Kassner, Ilmenau, DE;
Imedos GmbH, Jena, DE;
Abstract
A universal ophthalmic examination device and an ophthalmic examination method have the object of combining in an inexpensive apparatus in a simple manner the device-related requirements for image generation, measurement and functional imaging for carrying out visual stimulation and highly time-resolved and highly spatially resolved image documentation using continuous illumination and flash mode and the requirements for measurements in the infrared spectral region and visible spectral region with a time regime that can be freely selected to a great extent. The light of at least one light source is modified in a program-oriented manner with respect to its intensity curve and/or time curve with a temporally defined relationship to the adjustments of the at least one light source, of the image recording and of the evaluation for purposes of adaptive matching to an examination task in the illumination beam path by an individual, shared light manipulator and is used as modified light for illumination and for selective stimulation.