The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Feb. 16, 2002
Roland Bergner, Jena, DE;
Roland Barth, Jena, DE;
Axel Doering, Jena, DE;
Frank Behrend, Jena, DE;
Klaus-ditmar Voigt, Jena, DE;
Roland Bergner, Jena, DE;
Roland Barth, Jena, DE;
Axel Doering, Jena, DE;
Frank Behrend, Jena, DE;
Klaus-Ditmar Voigt, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
The invention relates to a method for determining distances in the anterior ocular segment, preferably of the pupils and/or the diameter of the iris, wherein the image of at least part of the eye is recorded and digitized using an imaging device and an array for illuminating the eye. On the basis of said digital image, a center of gravity analysis and the determination of the central point are carried out, especially for the position of the pupils, by conducting an intensity and threshold analysis as rough determination. Based on said rough determination, a fine detection of the position of the edges of the pupil and/or the edges of the iris is carried out. Additionally, the angle between the visual axis and the optical axis of the eye can be determined from the position of a fixed reflection to the center of the pupil and/or the center of the iris.