The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Feb. 05, 2004
Kyle Stickle, San Jose, CA (US);
Kyle Stickle, San Jose, CA (US);
Anritsu Company, Morgan Hill, CA (US);
Abstract
A sampling system is disclosed which measures high speed data signals by performing sampling events at intervals determined by a programmable DDS output frequency and a programmable counter. The reference frequency of the DDS is that of a clock signal that is synchronous with the data signal to be measured. The present invention is able to arrange the sample points to form an eye diagram of the input signal. In addition, the present invention is capable of sampling synchronously with the data clock and controlling the phase of the synthesized signal such that the samples are localized around the rising and falling edges of the data waveform. The present invention is thereby able to determine the location of the edges of the data signal and analyze the deterministic jitter of the waveform.