The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Apr. 09, 2004
Je-hyoung Ryu, Suwon, KR;
Sung-jin Lee, Suwon, KR;
Jun-ho Lee, Yongin, KR;
Tae-gyu Kim, Hwasung, KR;
Je-hyoung Ryu, Suwon, KR;
Sung-jin Lee, Suwon, KR;
Jun-ho Lee, Yongin, KR;
Tae-gyu Kim, Hwasung, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An inspecting apparatus for a semiconductor device having a match plate; a contact module combined with the match plate, including a radiation unit contacting a semiconductor device, and a test unit pressing leads of the semiconductor device; and a thermally conductive pad installed on a contacting face of the radiation unit of the contact module, to transfer heat from the semiconductor device to the radiation unit of the contact module. The present invention provides an inspecting apparatus for semiconductor devices that improves reliability of testing for durability of semiconductor devices against heat, and minimizes damage to the semiconductor devices during testing.