The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Mar. 06, 2006
Kenny C. Gross, San Diego, CA (US);
Dan Vacar, San Diego, CA (US);
Leoncio D. Lopez, Escondido, CA (US);
David K. Mcelfresh, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Dan Vacar, San Diego, CA (US);
Leoncio D. Lopez, Escondido, CA (US);
David K. McElfresh, San Diego, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
One embodiment of the present invention provides a system that tests the quality and/or the reliability of a component. During operation, the system applies test conditions to a plurality of specimens of the component. While applying the test conditions, the system measures the same variable from each of the plurality of specimens. Next, the system computes a running average of the measured variable across the plurality of specimens. The system then computes residuals between the measured variable for each specimen and the running average. The system next determines from the residuals whether the associated specimens are degraded.