The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Jun. 20, 2003
Makoto Maruya, Kanagawa, JP;
Makoto Maruya, Kanagawa, JP;
Abstract
Disclosed is a topographic measurement system wherein at least one satellite is used to scan the earth surface and send picture frames of a target area captured at different positions to an earth station. The picture frames are combined to produce a number of pairs of frames which constitute a stereoscopic image of the target area. Each frame pair is analyzed according to a number of visual characteristics and evaluated with a set of fitness values representative of the degrees of fitness of the frame pair to topographic measurement of the target area. A total of the fitness values is obtained from each frame pair and compared with the total values of other frame pairs. A frame pair having the highest total value is selected as a best pair. A parallax between the best pair frames is determined to produce first and second sets of line-of-sight vectors for conversion to topographic data.