The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Nov. 27, 2002
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Matthew William Turek, Glenville, NY (US);
James Vradenburg Miller, Clifton Park, NY (US);
Robert August Kaucic, Niskayuna, NY (US);
Peter Henry Tu, Schenectady, NY (US);
Tony Chishao Pan, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Matthew William Turek, Glenville, NY (US);
James Vradenburg Miller, Clifton Park, NY (US);
Robert August Kaucic, Niskayuna, NY (US);
Peter Henry Tu, Schenectady, NY (US);
Tony Chishao Pan, Niskayuna, NY (US);
General Electric Company, Niskiayuna, NY (US);
Abstract
A method and system for measuring disease relevant tissue changes for use in quantifying, diagnosing and predicting a given disease are provided. The method comprises applying at least one segmenting process to the image data to generate a plurality of segmented regions of interest, extracting features relevant for a given disease from the segmented regions to generate extracted features, and mathematically modeling the features for use in one of diagnosing, quantifying and predicting changes indicative of the given disease. The system comprises an imaging device for acquiring the image data and an image process configured to segment, extract and mathematically model disease relevant features.