The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Jan. 14, 2006
Applicants:
Paavana Sainath, Oconomowoc, WI (US);
Xiaoye Wu, Rexford, NY (US);
Masatake Nukui, Tokyo, JP;
Ronald Joseph Lundgren, Lisbon, WI (US);
Thomas John Myers, Wauwatosa, WI (US);
Inventors:
Paavana Sainath, Oconomowoc, WI (US);
Xiaoye Wu, Rexford, NY (US);
Masatake Nukui, Tokyo, JP;
Ronald Joseph Lundgren, Lisbon, WI (US);
Thomas John Myers, Wauwatosa, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/60 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for reconstructing an image of an object includes scanning the object with a computed tomography (CT) system to obtain data, estimating a size of the object using the obtained data, using the estimated size of the object to perform scatter correction on the obtained data, and reconstructing an image using the scatter corrected data.