The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Feb. 18, 2003
Applicant:

Tsutomu Matsuhira, Chiba, JP;

Inventor:

Tsutomu Matsuhira, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 1/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electronic device comprises an IC provided with an array of pads a preselected number of which define inspection pads of the IC. A substrate has inspection patterns and is mounted on the IC so that each inspection pad is brought into contact with a corresponding inspection pattern to thereby enable electrical inspection of a mounting condition of the IC on the substrate. A pair of inspection lands is provided on the substrate and connected to some of the inspection patterns. The inspection pads and the inspection patterns are connected by wiring provided on the IC or on the substrate so that the inspection lands are electrically connected to each other when the IC is mounted on the substrate. A centerline of at least one of the inspection patterns is offset in position from a centerline of the corresponding inspection pad in width directions of the inspection pattern and the inspection pad.


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