The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
May. 13, 2004
Kenta Mikuriya, Musashino, JP;
Takeo Tanaami, Musashino, JP;
Naoki Seki, Musashino, JP;
Takeharu Nagai, Itabashi, JP;
Atsushi Miyawaki, Wakou, JP;
Kenta Mikuriya, Musashino, JP;
Takeo Tanaami, Musashino, JP;
Naoki Seki, Musashino, JP;
Takeharu Nagai, Itabashi, JP;
Atsushi Miyawaki, Wakou, JP;
Riken, Wako, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A confocal optical scanner of Nipkow disk type for measuring a sample, in which each component of two or more color pigments, has a high reflection mirror for separating an excited light to be radiated onto the sample and a fluorescence emitted from the sample, wherein a reflectance of the high reflection mirror is from 80% to 100% in a measured wavelength region including at least an excited light wavelength region and a fluorescence wavelength region. Thereby, the confocal optical scanner capable of measuring a polychromatic fluorescent image at the same time is realized with the enhanced light receiving efficiency of fluorescence, using one high reflection mirror without using a plurality of dichroic mirrors by exchange.