The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Nov. 02, 2005
Applicant:

Yasushi Namii, Hachioji, JP;

Inventor:

Yasushi Namii, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A stereoscopic microscope including a light source section, an illumination optical system, and an observation optical system. The illumination optical system has an optical axis and includes a projection optical system. The projection optical system forms an intermediate image and irradiates a light flux from the light source section onto an observation object. The observation optical system includes an objective lens, a pair of left and right zooming optical systems for changing the magnification of the observation optical system, and a pair of left and right eyepiece optical systems. A center position of the light source section is de-centered from the optical axis of the illumination optical system. Also, the illumination optical system includes a reflecting member which has two rounded notches and is inserted into and removed from a space on the object side of the objective optical system in conjunction with a zooming operation.


Find Patent Forward Citations

Loading…