The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Jul. 11, 2006
Applicants:

Junichi Nozawa, Sagamihara, JP;

Motokazu Nakamura, Hino, JP;

Inventors:

Junichi Nozawa, Sagamihara, JP;

Motokazu Nakamura, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a surgical microscope having a horizontal movement arm portion which moves a microscope portion in a substantially horizontal direction, and a vertical movement arm portion which moves the microscope portion in a substantially vertical direction. A first elastic force generation mechanism connected with a base bottom portion and the horizontal movement arm portion generates an elastic force which offsets a rotation moment around a first horizontal rotation axis produced when the horizontal movement arm portion revolves around the first horizontal rotation axis arranged in the base bottom portion. Further, a second elastic force generation mechanism connected with the base bottom portion and the vertical movement arm portion generates an elastic force which offsets a rotation moment around a second horizontal rotation axis produced when the vertical movement arm portion revolves around the second horizontal rotation axis arranged in the horizontal movement arm portion.


Find Patent Forward Citations

Loading…