The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Mar. 26, 2004
Russell Bonaventura, Williamsville, NY (US);
Paul M. Harrison, Alden, NY (US);
Kenneth M. Northem, West Seneca, NY (US);
Russell Bonaventura, Williamsville, NY (US);
Paul M. Harrison, Alden, NY (US);
Kenneth M. Northem, West Seneca, NY (US);
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A microscope includes at least one focusing means for focusing an object plane. The focusing means includes first and second adjustment means. The first and second adjustment means are coaxial and independently rotatably adjustable with respect to one another. The second adjustment means are releasably fastenable to the focusing means. In a preferred embodiment, the first adjustment means comprises a coarse focus adjustment knob and the second adjustment means comprises a fine focus adjustment knob. The second adjustment means preferably includes magnetic means adapted for mating engagement with complementary magnetically attractable means of a rotatable focus drive means of the focusing means. A particularly preferred embodiment comprises at least two focusing means wherein the second adjustment means of each may be releasably attached to each; one on each opposite side of the microscope as desired.