The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Oct. 26, 2005
Richard J. Tansey, Half Moon Bay, CA (US);
Richard J. Tansey, Half Moon Bay, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method of performing closed loop correction of phase aberrations, including the steps of directing an incoming light beam into a black fringe wavefront sensor via an adaptive optical device ('AOD'), dividing the incoming light beam into measurement and reference beams, altering the path length of the measurement beam and the location of the black fringe by modulating a ramp voltage of a modulator, combining the measurement and reference beams into a common output beam, detecting the black fringe in the common output beam using detectors mapped to the AOD, storing, as tagged ramp voltages, a corresponding ramp voltage for each detector when it detects black fringe, calculating phase errors based upon the tagged ramp voltages and modulator scaling, calculating adaptive optics correction voltages based upon the phase errors, transmitting and applying the correction voltages to the AOD to correct phase aberrations of the incoming light beam via phase conjugation.