The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Sep. 22, 2003
Atsushi Okawa, Hachioji, JP;
Akihiro Horii, Hachioji, JP;
Tianyu Xie, Akiruno, JP;
Mitsuhiro Hara, Musashino, JP;
Atsushi Okawa, Hachioji, JP;
Akihiro Horii, Hachioji, JP;
Tianyu Xie, Akiruno, JP;
Mitsuhiro Hara, Musashino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An optical probe system comprises an optical probe that is inserted into a body cavity, a light source that generates light which is irradiated to an object, and a high-magnification observation unit included in the distal section of the optical probe. The optical probe system further comprises: an image digitization unit that digitizes a luminance signal produced by the high-magnification observation unit; an image parameter sampling unit that samples an image parameter from an image; an optimization parameter calculation unit that calculates an optimization parameter on the basis of the image parameter; an image optimization unit that optimizes an image according to the optimization parameter; an image display device on which an optimized image is displayed; and a digital image preservation unit in which a digitized image is preserved.