The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Apr. 11, 2003
Atsushi Takagi, Aichi-ken, JP;
Atsushi Takagi, Aichi-ken, JP;
Abstract
At first, a sample for obtaining light measurement data is set to obtain reflectances. After setting an arbitrary wavelength λ, a principal component analysis is executed to obtain an eigenvalue 1 and an eigenvector b. Then a basic equation for reflectance is determined by deriving a coefficient k, utilizing a known reflectance of an object of which reflectance is to be estimated. Thereafter a process of deriving a reflectance at an arbitrary displacement angle is executed for all the wavelengths, for example over a visible wavelength range. In this manner, the reflectance of an object at an arbitrary displacement angle can easily be obtained by utilizing the basic equation for the reflectance derived from the eigenvector obtained from the principal component analysis of the measured data.