The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Jun. 05, 2006
David J. Brady, Durham, NC (US);
Michael E. Gehm, Durham, NC (US);
Evan C. Cull, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
An optical spectrometer distinguishes ambiguity between different wavelength constituent components present in incident light. A spatial filter in the spectrometer spatially filters the incident light. A dispersion system receives the spatially filtered light and disperses images of the spatial filter in a wavelength dependent fashion such that two or more wavelength-specific images at least partially overlap at a detector system. The detector system comprises a detector array and processor that detects and processes the dispersed light to remove ambiguity between one or more of the overlapping images. The detector array may detect coded aperture images associated with a coded aperture spatial filter defined by a coded aperture function, and the processor may process the detector array output signals using an analysis function that complements the coded aperture function. The detector system may filter the spatial filter images and electronically process the resulting detector array output signals.