The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Apr. 08, 2004
Dongmao Zhang, West Lafayette, IN (US);
Dor Ben-amotz, West Lafayette, IN (US);
Yong Xie, West Lafayette, IN (US);
Vincent J. Davisson, West Lafayette, IN (US);
Melissa Mrozek, Lafayette, IN (US);
Corasi Ortiz, West Lafayette, IN (US);
Dongmao Zhang, West Lafayette, IN (US);
Dor Ben-Amotz, West Lafayette, IN (US);
Yong Xie, West Lafayette, IN (US);
Vincent J. Davisson, West Lafayette, IN (US);
Melissa Mrozek, Lafayette, IN (US);
Corasi Ortiz, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
Micro-droplets of liquid confining organic molecules of interest are dried on selected planar solvo-phobic substrates under conditions facilitating segregated precipitation of the larger, less soluable analytes toward edge portions of the deposit. Micro-spectrometer imaging using white light and FTIR false color can identify points of interest, and the same optics generally directed perpendicularly to the substrates selectively captures normal Raman spectra from selected points in the deposit. The spectra are manipulated using various data techniques to extract reliable information concerning analytes present at pico-Molar levels. The selected spots can also be subjected to FTIR spectroscopy followed by MALDI mass spectroscopy to obtain a variety of information from the identical specimen.