The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Mar. 24, 2004
Lidu Huang, Danville, CA (US);
Alexei Glebov, San Mateo, CA (US);
Shigenori Aoki, Sunnyvale, CA (US);
Michael G. Lee, San Jose, CA (US);
Kishio Yokouchi, San Jose, CA (US);
Lidu Huang, Danville, CA (US);
Alexei Glebov, San Mateo, CA (US);
Shigenori Aoki, Sunnyvale, CA (US);
Michael G. Lee, San Jose, CA (US);
Kishio Yokouchi, San Jose, CA (US);
Fujitsu Limited, Kanagawa, JP;
Abstract
Methods and apparatuses for measuring the optical properties of solids, gels, and liquids are disclosed. The apparatuses may be constructed on miniature substrates using conventional semiconductor wafer and packaging processes. The substrates may be mass-produced on wafers, which are then diced to provide individual miniature substrates. High measurement precision, low-manufacturing costs, and other benefits are provided by the present inventions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile