The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Jul. 24, 2003
Tim Vermeiren, Zele, BE;
Tom Bostoen, Brugge St. Andries, BE;
Leonard Pierre Van Biesen, Aalst, BE;
Frank Louage, Putte, BE;
Patrick Jan Marie Boets, Heffen, BE;
Tim Vermeiren, Zele, BE;
Tom Bostoen, Brugge St. Andries, BE;
Leonard Pierre Van Biesen, Aalst, BE;
Frank Louage, Putte, BE;
Patrick Jan Marie Boets, Heffen, BE;
ALCATEL, Paris, FR;
Abstract
Interpretation systems for interpreting reflectometry information are provided with modules for making interpretations, with each module comprising a generating module-part, a testing module-part, and a debugging module-part, and with one module being a generating system-part for a next module and with said next module being a testing system-part and a debugging system-part for said one module, to introduce improved intelligence. These interpretation systems have double-level Generate-Test-Debug (GTD) structures, two at module level as well as one at system level. This improved intelligence can be further improved by introducing a third module resulting in three GTD structures at module level and two GTD structures at system level. Interpretations are pulse-based, energy-based, simulation-based for rough, medium, and precise interpretation for increasing the efficiency of the improved intelligence.