The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Mar. 03, 2006
Guiren Wang, Huntsville, AL (US);
Hong Jiang, Huntsville, AL (US);
Guiren Wang, Huntsville, AL (US);
Hong Jiang, Huntsville, AL (US);
Other;
Abstract
Methods and apparatus for fluid flow velocity and flow rate measurement are provided. Fluid velocity is measured in optical method based on fluorescence photobleaching of a fluorescent dye. The invented method and apparatus requires a calibration relation between flow velocity and fluorescence signal and is easy to use. The invented method and apparatus can measure bulk flow velocity and flow rate inline, two and three components of flow velocity vector. It can also measure flow velocity in near wall region using evanescent wave. Since the invented method and apparatus uses molecular dye and calibration relation between flow velocity and fluorescence signal, it has ultra high spatial and temporal resolution. The invented method can be used not only to apparatuses and devices in conventional size, but also to that in MEMS and NEMS.