The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Nov. 15, 2002
Applicants:

Timothy Alderson, Winter Spring, FL (US);

Gene D. Tener, Oviedo, FL (US);

Jeffrey M. Davis, Oviedo, FL (US);

Inventors:

Timothy Alderson, Winter Spring, FL (US);

Gene D. Tener, Oviedo, FL (US);

Jeffrey M. Davis, Oviedo, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of processing image data comprises obtaining a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, obtaining information identifying one or more defective sensing elements of the detector array, receiving image data from the detector array, calculating a weighted average of pixel values from sensing elements adjacent to a first defective sensing element of the detector array using at least some of the weighting coefficients, and assigning the weighted average to be a replacement pixel value for the first defective sensing element. An apparatus for processing image data according to the method is also described.


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