The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Mar. 24, 2005
Applicants:

Gregory Steven Lee, Mountain View, CA (US);

Robert C. Taber, Palo Alto, CA (US);

Izhak Baharav, Palo Alto, CA (US);

Inventors:

Gregory Steven Lee, Mountain View, CA (US);

Robert C. Taber, Palo Alto, CA (US);

Izhak Baharav, Palo Alto, CA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 15/00 (2006.01); H01Q 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning panel for use in a microwave imaging system captures a microwave image of a target using two complementary arrays of antenna elements. Each of the antenna elements in a first array is capable of being programmed with a respective phase delay to direct a transmit beam of microwave illumination toward the target in a transmit beam pattern, and each of the antenna elements in a second array is capable of receiving reflected microwave illumination reflected from the target in a receive beam in a receive beam pattern complementary to the transmit beam pattern. The microwave image of the target is formed at an intersection between the transmit beam and the receive beam.


Find Patent Forward Citations

Loading…