The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Dec. 05, 2005
Applicant:
Wen-dong Yen, Tainan, TW;
Inventor:
Wen-Dong Yen, Tainan, TW;
Assignee:
Silicon Integrated Systems Corp., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An improved apparatus and method for testing experiment is disclosed. The apparatus includes a motherboard and a stress module. The motherboard includes a component under test. A stress module connects the component and contacts the component directly. The stress module can provide the component with various rages of temperature and voltage for test. Besides, the stress module also can provide an anti-electrostatic device to prevent electrostatic disturbance.