The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Jan. 12, 2006
Applicants:

Minseok Park, Hitachinaka, JP;

Shuya Hagiwara, Mito, JP;

Hideta Habara, Musashino, JP;

Inventors:

Minseok Park, Hitachinaka, JP;

Shuya Hagiwara, Mito, JP;

Hideta Habara, Musashino, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an NMR measurement method using an NMR apparatus which converts a received signal to digital data using an analog/digital converter and performs a spectral analysis, a folding and aliasing count is decided from a variation in a peak frequency and frequency discrimination is performed. More specifically, a Nyquist frequency is changed to cause a variation of the peak frequency. Since the Nyquist frequency is inversely proportional to an increment of an evolution time twhich is a feature of multi-dimensional NMR, the Nyquist frequency can be changed by changing the increment of the evolution time. Furthermore, the Nyquist frequency is changed in such a way that a ratio between different Nyquist frequencies is not a ratio between natural numbers nand nwhich are greater than 0 and smaller than or equal to the maximum folding and aliasing count.


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