The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Sep. 27, 2006
Applicant:

Nan-hsiung Tsai, Shanghai, CN;

Inventor:

Nan-Hsiung Tsai, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ion doping method to form source and drain is disclosed. First form a gate structure and a gate spacer on a semiconductor substrate, and then use dielectric layer having trenches therein to define heavily ion-doped positions and use a Y-shaped polysilicon layer formed in the trenches. Perform an ion implantation, by using the polysilicon layer, gate spacer and dielectric layer as a barrier layer, to naturally form ion doped regions of source/drain, so as to make components, which are minimized in the increased packing density, still have a gate structure keeping an enough channel length.


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