The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2007

Filed:

Jul. 21, 2005
Applicant:

Lloyd Allred, Bountiful, UT (US);

Inventor:

Lloyd Allred, Bountiful, UT (US);

Assignee:

Bausch & Lomb Incorporated, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A corneal topography slit image alignment systemincludes a half-slit projectorfor projecting half-slit images onto a patient's eyeHalf-slit imagesandare aligned into a single slit image. A cameracaptures an image of the aligned slit image. Processorincluding a memoryconnected to the half-slit projectorand the cameraanalyzes the alignment of the half-slit imagesandAn edge detectordetects the edges of each captured half-slit image and determines an amount of misalignment of the half-slit imagesandrelative to half-slit images being aligned into a single slit image. This amount of misalignment allows computer processorto correct the three-dimensional coordinates of the slit images obtained by a slit beam system


Find Patent Forward Citations

Allred, Lloyd. (2007). Corneal topography slit image alignment via analysis of half-slit image alignment (U.S. Patent No. 7281799). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7281799

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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