The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Mar. 14, 2005
Applicants:
Tsuyoshi Moriyama, Toride, JP;
Norifumi Miyake, Kashiwa, JP;
Takayuki Fujii, Tokyo, JP;
Yasuo Fukatsu, Abiko, JP;
Takako Hanada, Yokohama, JP;
Inventors:
Tsuyoshi Moriyama, Toride, JP;
Norifumi Miyake, Kashiwa, JP;
Takayuki Fujii, Tokyo, JP;
Yasuo Fukatsu, Abiko, JP;
Takako Hanada, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65H 37/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
Sheet thickness data obtained from the output of a sheet thickness detecting sensor are calculated to thereby calculate a sheet bundle thickness. When the sheet bundle thickness reaches a predetermined value, other aftertreatment differing from a set aftertreatment is executed.
Moriyama, Tsuyoshi. (2007). Aftertreatment apparatus, and controlling method, program and storage medium therefor (U.S. Patent No. 7281707). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7281707
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile